V 2026/244
- Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)
Meddelande om upphandling
Sista anbudsdag är 2026-08-24, annonsen visas mellan 2026-06-30 och 2026-08-24. Utförandeort Skåne län.
Lund Nano Lab (LNL) at Lund University intends to purchase a Focused Ion Beam Scanning Electron Microscope, in this document referred to as the FIB-SEM, instrument
or equipment. This document lists all the requirements the FIB-SEM must meet.
The instrument is intended to be used for high-resolution imaging, materials analysis and preparing samples for TEM analysis as well as for experiments at the MAX IV
synchrotron.